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The 12th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP 2014) will take place in Grenoble & Villard-de-Lans, in September 2014.

Click to download the XTOP 2014 flyer

XTOP 2014 flyer

Registration is now open !

History and scope


The first XTOP conference (“ X-Ray Topography and High Resolution Diffraction ”) took place in Marseille in 1992. The original topics covered were topography, double- and triple-crystal diffractometry of epitaxial layers, reflectometry and standing waves technique, with other added at later meetings. Topics for XTOP '2014 hold to the traditions of all the previous conferences.

XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray phase contrast imaging (radiography and micro- tomography). XTOP is thus one of the central scientific conference concerning methods and instrumentation in synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.

Previous XTOP conferences:

  • 1992: Marseille (France)
  • 1994: Berlin (Germany)
  • 1996: Erice (Italy)
  • 1998: Durham (United Kingdom)
  • 2000: Ustron-Jaszowiec (Poland)
  • 2002: Aussois (France)
  • 2004: Prague (Czech Republic)
  • 2006: Baden-Baden (Germany)
  • 2008: Linz (Austria)
  • 2010: Warwick (United Kingdom)
  • 2012 : St Petersburg (Russia)