The XTOP Companion School will take place on Sunday afternoon and Monday morning, in the ESRF Auditorium.

The school registration fees include coffee breaks, dinner on Sunday and lunch on Monday before going by bus to Villard-de-Lans for the main XTOP conference.

Accomodation is not included in the registration fees, so participants should reserve a hotel in Grenoble for Sunday night. Note that the tram joining the Avenue des Martyrs (with a stop close to ESRF) to downtown Grenoble will be operational in September, so public transportation will be easy to downtown hotels.

Programme & speakers

Sunday, 14:00-15:00 Ray Barrett - Hard X-ray optics for Synchrotron Radiation Beamlines

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Abstract: The presentation  will attempt to give a broad introduction to the requirements and operating principles of X-ray optical systems for synchrotron beamlines. Through illustrated examples, it will show the highly diverse classes of optical devices which are implemented at hard X-ray light sources in order to tailor the beam characteristics to the experimental requirements

About the speaker: Following over 10 years as a scientist on various (mostly imaging) beamlines, Ray Barrett is now leader of the ESRF X-ray Optics Group of the ESRF. The responsibilities of the group include the design, procurement, manufacture and measurement of the X-ray optics for all ESRF beamlines. In addition, the group conducts research into the development and characterisation of new optical devices.

Short break

Sunday 15:15-16:15 Tilo Baumbach - Dynamical theory and topography

Abstract: Beginning from multiple scattering principles addressed by the Dynamical Theory of X-ray Diffraction the tutorial will give an introduction into Full Field X-Ray Diffraction Imaging techniques and will highlight common issues and differences in comparison to other X-ray techniques met at X-TOP. 

The talk will outline the measuring principles of techniques such as X-ray topography, rocking curve imaging, and Bragg-magnifier based imaging, and will discuss their most relevant imaging geometries and contrast mechanisms. Further, it will mention recent methodical extensions to spatiotemporally resolved imaging of defect evolution during processing and to tomography / laminography based diffraction imaging. The scientific and technological potential of the techniques will be illustrated by examples from different fields of basic and applied research.

About the speaker: Prof. Dr. Gerd Tilo Baumbach, PhD, is currently Professor of Physics and Head of ANKA and the Institute for Photon Science and Synchrotron Radiation at Karlsruhe Institute of Technology.  He has extensive experience of neutron and X-ray techniques, having been scientist at neutron and synchrotron facilities such as the ILL, ESRF and ANKA for many years.  His current interests include X-ray scattering and imaging, nano- and micro characterization, and their application to nano-science and life sciences.

Tea break

Sunday 16:45-17:45 Peter Zaumseil - High Resolution X-ray Diffractometry (HRXRD)

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Abstract: A definition of high-resolution XRD is given. Typical optical elements used for HRXRD are discussed and how they influence the measured intensity distribution. Some typical examples of mainly lab-based experiments with state of the art diffractometers will be presented.

About the speaker: Physics diploma at Friedrich-Schiller-University Jena on X-ray topography in 1976
Dissertation A (Dr. rer. nat.) at the same university on  X-ray phase contrast techniques in 1980
Dissertation B (Dr. sc. nat.) at the same university on X-ray triple crystal diffractometry in 1990
Since 1979 working at IHP in Frankfurt (Oder), Germany.

Dinner @ESRF

Monday 08:30-9:30 Manuel Guizar-Sicairos - Phase contrast imaging "from Fresnel to Fraunhofer"

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Abstract: Our everyday imaging experience is by far dominated by intensity contrast, the attenuation of intensity due to absorption or scattering. However many techniques in optical, X-ray and neutron imaging have been developed to attain increased contrast in almost transparent samples by detecting the variations in the phase of the transmitted field. We will discuss the workings of some of these phase contrast imaging techniques with an emphasis on lensless imaging and quantitative X-ray phase tomography.

About the speaker: Manuel Guizar-Sicairos obtained his BSc in physics engineering and MSc in electronic systems from the Tecnologico de Monterrey, Mexico and his PhD from the Institute of Optics, US. He currently works as beamline scientist at the Swiss Light Source, Switzerland, in algorithm and method development for X-ray ptychographic tomography.

Tea break

Monday 09:50-10:50 Wolfgang Ludwig - 3D X-ray diffraction imaging techniques

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Abstract: Over recent years a number of 3D diffraction imaging techniques for the analysis of the microtexture and grain structure in polycrystalline materials have been developed.  In this tutorial lecture we will provide an overview on this field of research and discuss basic concepts, possibilities and limitations of different experimental approaches which are now routinely available to the user community at large scale facilities.

About the speaker: Wolfgang Ludwig (INSA Lyon, senior scientist CNRS)  studied physics at TU Munich. After his PhD at the ESRF in the field of X-ray tomography, he has continued to work on the development and applications of 3D imaging and diffraction techniques using X-rays and neutrons.

Short break

Monday 11:00-12:00 David Babonneau - Grazing incidence small-angle x-ray scattering: theory and applications

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Abstract: Since the late 1980s, grazing incidence small-angle x-ray scattering (GISAXS) has emerged as a powerful tool to characterize the morphology and organization of nanostructures located near surfaces or buried interfaces. In this tutorial, the basic principles of the technique as well as fundamentals of data analysis will be introduced and illustrated by a number of practical applications.

About the speaker: David Babonneau is a CNRS research scientist at the Institute P’ in Poitiers University. His research is focused on the use of broad ion beams for the nanostructuration of surfaces and thin films. He has been involved in the characterization of nanostructured materials by GISAXS since 1996.

Lunch @ESRF